REWORK,FOCUS RING 344.5

PART DETAILS

2L10-251855-11
REWORK,FOCUS RING 344.5

OEM P/N: 

2L10-251855-11

ESCT P/N: 

ES7099-111

PART TYPE:

2nd Source NEW

OEM: 

TEL
MORE INFO

Reworked focus ring 344.5 mm (OEM P/N 2L10-251855-11), edge-confinement consumable for TEL 300 mm plasma etch systems

ESCT P/N ES7099-111, 2nd-source new, OEM-compatible focus ring for Tokyo Electron etch chambers

The focus ring described by the OEM designation 2L10-251855-11 is a circumferential consumable that sits in the periphery of the lower electrode assembly inside a Tokyo Electron (TEL) 300 mm plasma etch chamber. The “344.5” in the part name refers to its nominal outer diameter in millimetres, a dimension chosen so that the ring frames a 300 mm wafer with a controlled annular gap, surrounding the wafer edge with a sacrificial surface that carries the plasma sheath outward beyond the silicon. In service it is one of the most influential pieces of hardware in the entire etch kit, because it dictates what the plasma “sees” at the wafer edge.

Because it is positioned directly in the path of energetic ions and reactive radicals, the focus ring is a wear part by design. The “REWORK” prefix in the raw part name reflects how these rings are managed in the field: they are precision-machined components whose critical surfaces erode over thousands of RF hours, and they are routinely replaced or reworked to restore the original profile. ESCT supplies ES7099-111 as a 2nd-source, newly manufactured ring built to match the form, fit and function of the TEL original, giving fabs a cost-controlled, lead-time-friendly alternative to single-sourcing this high-turnover consumable.

Understanding why a single ring matters so much starts with the physics of the wafer edge. Without a focus ring, the plasma sheath would bend sharply where the conductive silicon wafer ends, distorting ion trajectories and causing the outermost dies to etch at the wrong rate and the wrong angle. The 344.5 mm ring extends the effective electrical and topographical surface past the wafer, so that the sheath stays flat and the edge dies behave like the centre.

Functional role of the focus ring in TEL plasma etch platforms

In a TEL 300 mm etch chamber the focus ring works alongside the electrostatic chuck, the cover/insulator rings and the upper electrode to shape the plasma at the wafer perimeter. Its responsibilities are both electrical and geometric:

  • Extends the plasma sheath radially outward so the sheath remains parallel to the wafer surface across the outermost dies, preserving vertical etch profiles to the wafer edge.
  • Defines the annular gap between wafer edge and ring, a tolerance that directly governs edge etch rate and critical-dimension (CD) uniformity in the final few millimetres.
  • Provides a sacrificial surface that absorbs ion bombardment and erodes in place of the chamber and chuck hardware behind it.
  • Helps confine the plasma above the active wafer area, supporting consistent species density and reducing edge-localised polymer or by-product build-up.
  • Participates in the RF environment at the wafer periphery, influencing local sheath voltage and therefore the energy with which ions arrive at the edge.
  • Protects the underlying electrode and insulator surfaces from direct sputter erosion, extending the service life of higher-value chamber components.

Material and process performance

Material selection and plasma resistance

Focus rings of this class are produced from process-matched materials, most commonly high-purity silicon, but also silicon carbide or quartz depending on the chemistry and the OEM recipe, chosen so that any sputtered material is compatible with the process and does not introduce metallic or particulate contamination. Material grade matters because it sets both the erosion rate and the contamination signature of the ring over its life.

  • High purity to avoid seeding the wafer edge with mobile-ion or metallic contamination.
  • Controlled resistivity so the ring’s electrical behaviour matches the OEM design and the sheath geometry stays predictable.
  • Resistance to fluorine- and chlorine-based chemistries and to thermal cycling between idle and high-power states.

Dimensional precision at 344.5 mm

The 344.5 mm outer diameter, the inner step that registers against the wafer edge, the seat flatness and the surface finish are all toleranced features. Small departures in any of them shift the sheath and degrade edge uniformity, which is why a reworked or replacement ring must reproduce the OEM geometry faithfully rather than approximately.

  • Outer diameter held to 344.5 mm nominal so the ring frames the wafer with the designed annular clearance.
  • Flat, parallel seating face for repeatable thermal and electrical contact with the chuck periphery.
  • Consistent surface finish to give a predictable starting erosion profile and stable particle behaviour.

Impact on tool performance and yield

Because the focus ring controls the etch environment exactly where edge dies live, its condition maps almost directly onto edge yield. As the ring erodes, the sheath above the wafer edge drops and tilts, and the consequences appear in the data well before any visible damage:

  • Edge-to-centre etch rate drift, widening within-wafer non-uniformity and pushing edge CDs out of specification.
  • Tilted or tapered profiles on the outermost dies as the local sheath loses its vertical orientation.
  • Rising edge defect and particle counts as the ring surface roughens and sheds material.
  • Shrinking usable edge exclusion zone, reducing the number of good dies per wafer.
  • More frequent recipe re-centring and chamber matching effort to compensate for a worn ring.
  • Unplanned downtime if erosion is allowed to progress to the point of exposing or damaging the hardware beneath the ring.

Common wear and failure modes

Erosion and thinning

The dominant failure mode is gradual erosion of the upper surface by ion bombardment. As the ring thins, the step height relative to the wafer changes, the sheath recedes and edge uniformity degrades. This is an expected end-of-life mechanism and is the primary reason the ring is treated as a scheduled-replacement consumable.

Cracking and chipping

Brittle ring materials are vulnerable to thermal-shock cracking and to mechanical chipping during handling, transfer or seating. A cracked ring can shed large particles onto the wafer edge and may compromise the electrical and thermal contact with the chuck periphery, so any chip or crack found during inspection warrants immediate replacement.

Deposition build-up and arcing

Process by-products and polymer can accumulate on and around the ring, flaking off as defects or creating conditions for localised arcing. Arcing damage roughens the surface, accelerates erosion and can leave burn marks that disturb the local field, all of which feed back into edge non-uniformity.

Installation and replacement guidance

Focus ring replacement is a routine preventive-maintenance task on TEL etch tools, but it must follow the OEM procedure for the specific chamber. The following sequence is a general outline and does not replace the documented work instruction for your platform:

  • Place the chamber in a safe maintenance state: vent per procedure, confirm RF and gases are isolated and allow components to reach a safe handling temperature.
  • Open the chamber and remove any cover or insulator rings sitting above the focus ring, noting their orientation for correct reassembly.
  • Lift out the worn focus ring using clean, particle-free handling, and inspect the chuck periphery and seat for residue, erosion or damage.
  • Clean the seating area as specified so the new ring beds flat with good thermal and electrical contact.
  • Install ES7099-111 with gloved or tooled handling, seating it concentrically and confirming it sits flat with no rocking and the correct annular gap to the wafer position.
  • Reinstall the cover/insulator rings, close the chamber, pump down and run the prescribed leak check and seasoning or conditioning recipe.
  • Verify edge etch performance with a monitor wafer and reset the consumable life counter for the new ring.

Spare parts strategy for TEL etch consumables

Focus rings are high-frequency consumables, so the way a fab sources them has a direct effect on cost per wafer and chamber availability. ESCT supplies ES7099-111 as part of a broader TEL etch consumable programme designed around predictable supply and verified quality:

  • 2nd-source, newly manufactured rings verified to the form, fit and function of the OEM 2L10-251855-11.
  • A typical lead time of 4-5 weeks, supporting planned preventive-maintenance scheduling and buffer-stock strategies.
  • Cost-controlled alternative to single-source OEM purchasing for a part that is consumed in volume.
  • Cross-reference by both ESCT and OEM part numbers to simplify ordering and stores management.
  • Support from a supplier focused on TEL 300 mm etch hardware, including focus rings, edge rings and silicon electrode parts.

Frequently asked questions

What does the “344.5” in the part name mean?

It is the nominal outer diameter of the ring in millimetres. At 344.5 mm the ring frames a 300 mm wafer with a controlled annular gap, positioning its sacrificial surface just beyond the wafer edge so the plasma sheath stays flat across the outermost dies.

Is this an original TEL OEM part?

No. ES7099-111 is a 2nd-source, newly manufactured, OEM-compatible focus ring. It is built and verified to match the form, fit and function of the TEL original 2L10-251855-11, but it is not an original OEM part and is not supplied as one.

Why is “REWORK” in the part name?

The term reflects how these precision rings are managed as wear parts, their critical surfaces are restored or replaced on a maintenance cycle. ESCT supplies this item as a new, ready-to-install ring that fulfils that replacement role.

How do I know when the focus ring needs replacing?

The usual indicators are drifting edge etch rate and CD uniformity, tilted edge profiles, rising edge particle or defect counts, and an accumulated RF-hour count approaching the limit your process of record defines. Visible erosion, cracking or arcing damage at inspection are immediate replacement triggers.

What is the lead time for ES7099-111?

The typical lead time is 4-5 weeks. Because focus rings are consumed regularly, we recommend aligning orders with your preventive-maintenance plan and holding appropriate buffer stock to protect chamber uptime.

Will using this ring affect my process or chamber matching?

Because it is manufactured to the OEM geometry and a process-matched material grade, it is intended to drop into the existing recipe and chamber-matching framework. As with any consumable change, install a fresh ring during scheduled maintenance and confirm edge performance with a monitor wafer before returning the chamber to production.

Summary

The 344.5 mm focus ring (OEM P/N 2L10-251855-11, ESCT P/N ES7099-111) is a critical edge-confinement consumable for TEL 300 mm plasma etch chambers. By extending the plasma sheath beyond the wafer and defining the annular gap at the wafer edge, it governs edge etch uniformity, profile control and particle performance on the outermost dies, the region where yield is most easily lost. As a sacrificial part it erodes, cracks or accumulates deposition over its RF life and must be replaced on a maintenance schedule. ESCT supplies it as a 2nd-source, newly manufactured, OEM-compatible ring with a 4-5 week lead time, giving fabs a cost-effective and dependable way to keep their TEL etch chambers on specification.

Disclaimer: This part is supplied by ESCT Fab Support as a new, OEM-compatible second-source component, verified to the form, fit and function of Tokyo Electron part number 2L10-251855-11. It is not an original OEM part and is not sold as one. It is not manufactured by, endorsed by, or affiliated with Tokyo Electron, and all manufacturer names and part numbers are quoted for identification and compatibility purposes only.

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