FOCUS RING,360-T3.6 FLAT

PART DETAILS

2L10-251877-11
FOCUS RING,360-T3.6 FLAT

OEM P/N: 

2L10-251877-11

ESCT P/N: 

ES7099-114

PART TYPE:

2nd Source NEW

OEM: 

TEL
MORE INFO

2L10-251877-11 Focus ring for Tokyo Electron systems

360 Mm flat profile focus ring for plasma uniformity and edge control, Tokyo Electron platforms, 2L10-251877-11

The 2L10-251877-11 (FOCUS RING, 360-T3.6 FLAT) is a precision-engineered focus ring used within Tokyo Electron plasma etch systems, designed to control plasma distribution at the wafer edge and give uniform process conditions across 300 mm wafer platforms.

Positioned around the wafer on the electrostatic chuck (ESC), this focus ring shapes the electric field and plasma density at the wafer perimeter. Its flat profile and defined thickness (T3.6) are optimised for specific process conditions, enabling consistent edge performance while protecting chamber hardware from direct plasma exposure.

Functional role within Tokyo Electron systems

The 2L10-251877-11 focus ring functions as a critical plasma-facing consumable.

Core functions include:

  • Controlling plasma density and electric field at the wafer edge
  • Holding etch or deposition uniform across the wafer surface
  • Minimising edge exclusion and process non-uniformity
  • Acting as a sacrificial component to protect chamber hardware
  • Supporting stable and repeatable process conditions

It operates alongside ESCs, electrodes, insert rings, and other chamber hardware components.

Design and performance characteristics

Edge plasma control and uniformity

The focus ring directly influences wafer edge performance.

Key characteristics include:

  • Optimised geometry for uniform plasma distribution across 300 mm wafers
  • Flat profile design for consistent plasma interaction
  • Reduced edge effect variation in advanced processes
  • Stable performance across process cycles

Geometry and thickness specification (360-T3.6 FLAT)

The ring’s dimensions are critical to process tuning.

Performance features include:

  • 360 mm class design for full wafer coverage
  • T3.6 thickness profile controlling sheath behaviour and ion distribution
  • Flat surface geometry for predictable plasma interaction
  • Tight dimensional tolerances for repeatability

Material compatibility and plasma resistance

The focus ring is exposed to aggressive plasma conditions.

Durability features include:

  • Materials selected for plasma erosion resistance
  • Compatibility with reactive etch chemistries
  • Low particle generation characteristics
  • Stable performance under high-energy plasma exposure

Impact on process performance, yield, and tool uptime

The 2L10-251877-11 focus ring is directly tied to process quality and yield.

Potential impacts of wear or degradation include:

  • Edge non-uniformity in etch or deposition
  • Increased wafer edge defects
  • Reduced usable wafer area
  • Process drift and variability
  • Increased particle generation
  • Reduced process window margins
  • More frequent maintenance and downtime

Replacing a worn focus ring restores plasma uniformity and process control.

Common failure modes and diagnostic indicators

Plasma erosion and geometry drift

Continuous plasma exposure alters ring dimensions.

Indicators include:

  • Surface erosion or rounding
  • Reduction in thickness (T3.6 drift)
  • Changes in plasma behaviour
  • Edge process instability

Particle generation and surface degradation

Material wear introduces contamination.

Symptoms include:

  • Increased particle counts
  • Surface roughening or flaking
  • Yield-impacting defects
  • Chamber contamination

Edge process degradation

Worn rings affect wafer edge conditions.

Indicators include:

  • Increased edge exclusion
  • Non-uniform etch/deposition near perimeter
  • Increased wafer-to-wafer variability

Installation and maintenance best practices

For best performance:

  • Handle using strict cleanroom protocols
  • Inspect for erosion, cracks, or contamination before installation
  • Replace based on wear thresholds or PM schedules
  • Check seating and alignment on ESC
  • Perform chamber seasoning and qualification after replacement
  • Monitor edge uniformity and particle trends

OEM part number and compatibility

The 2L10-251877-11 (360-T3.6 FLAT) is a Tokyo Electron OEM focus ring.

Key considerations:

  • Must match chamber geometry and process requirements
  • Thickness and profile are critical for plasma tuning
  • Compatibility depends on tool type and process recipe
  • Always verify OEM specifications before replacement

Why source from ESCT Fab Support

ESCT advantages

  • OEM-aligned dimensional and material verification
  • Cleanroom-compliant handling and packaging
  • Verified compatibility with Tokyo Electron systems
  • Faster availability vs OEM lead times
  • Reduced Mean Time To Repair (MTTR)
  • Expertise in plasma-facing consumables

Frequently asked questions

1. What does “360-T3.6 FLAT” mean?

It refers to a 360 mm class focus ring with a 3.6 mm thickness and a flat surface profile, which directly influences plasma behaviour and edge control.

2. How does this focus ring affect plasma uniformity?

It shapes the electric field at the wafer edge, giving consistent plasma density and uniform etch or deposition rates across the wafer.

3. Why is thickness (T3.6) critical?

Thickness determines how the plasma sheath forms at the wafer edge. Even small deviations can markedly impact process uniformity.

4. How is this different from an insert ring?

A focus ring actively controls plasma behaviour, while an insert ring primarily protects chamber components.

5. What are early signs of focus ring wear?

Edge non-uniformity, increased particles, visible erosion, and process drift.

6. Can a worn focus ring still be used temporarily?

Yes, but it increases risk of yield loss, edge defects, and process instability.

7. How often should it be replaced?

Based on process chemistry, plasma intensity, and PM schedules. Monitoring edge performance is key.

8. Can ESCT match OEM specifications?

Yes. ESCT verifies material quality, geometry, and performance aligned with OEM requirements.

9. What happens if the wrong profile is used?

Incorrect geometry can disrupt plasma distribution, leading to non-uniform processing and yield loss.

10. Does this component protect other chamber parts?

Yes. It acts as a sacrificial component, reducing wear on more expensive chamber hardware.

Summary

The 2L10-251877-11 focus ring (360-T3.6 FLAT) is a mission-critical plasma-facing consumable within Tokyo Electron systems, controlling wafer edge plasma behaviour and holding process uniformity. Its geometry and condition directly impact yield, edge performance, and overall tool stability.

Sourcing through ESCT Fab Support gives you verified material quality, precise dimensional accuracy, and faster availability, helping maintain consistent process control and high-performance semiconductor manufacturing.

Disclaimer: This part is supplied by ESCT Fab Support as a new, OEM-compatible second-source component, verified to the form, fit and function of Tokyo Electron part number 2L10-251877-11. It is not an original OEM part and is not sold as one. It is not manufactured by, endorsed by, or affiliated with Tokyo Electron, and all manufacturer names and part numbers are quoted for identification and compatibility purposes only.

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