ELECTRODE UPPER LD777

PART DETAILS

DEB-1810-121988-11W
ELECTRODE UPPER LD777

OEM P/N: 

DEB-1810-121988-11W

ESCT P/N: 

ES7099-023

PART TYPE:

2nd Source NEW

OEM: 

TEL
MORE INFO

Upper electrode cathode LD777 (OEM P/N DEB-1810-121988-11W), plasma-facing upper cathode for TEL 300 mm etch systems

ESCT P/N ES7099-023, 2nd source NEW upper electrode cathode for Tokyo Electron plasma etch chambers

The Upper Electrode Cathode LD777 is the powered upper-electrode assembly component that sits directly opposite the wafer in a Tokyo Electron (TEL) 300 mm plasma etch chamber. In the capacitively coupled etch architectures TEL builds, the upper electrode forms the ceiling of the discharge gap and, together with the lower electrode and electrostatic chuck, defines the volume in which the plasma is struck and sustained. This particular part is the cathode element of that upper stack, the conductive, plasma-facing surface through which RF energy is coupled into the gas and across which the electrical reference for the discharge is established.

Because it is mounted at the top of the chamber and bathed continuously in reactive plasma and energetic ions, the upper electrode cathode is a true chamber consumable. Its surface is sputtered, etched and chemically attacked over thousands of RF hours, and its condition has a direct and measurable effect on etch rate, within-wafer uniformity, plasma stability and particle performance. When the surface degrades, the entire chamber drifts away from its qualified process window, which is why the LD777 cathode is treated as a scheduled-replacement item in most fab preventive-maintenance plans.

ESCT Fab Support supplies this component under part number ES7099-023 as a 2nd Source NEW item, manufactured to match the form, fit and function of the original TEL upper electrode, with a typical lead time of 4-5 weeks. It is intended for engineers who need to keep TEL etch tools qualified and productive without being held to single-source OEM availability.

Functional role of the upper electrode cathode in TEL plasma etch platforms

In a TEL 300 mm etch chamber the upper electrode is far more than a passive lid. It is an active, multi-function element of the plasma generation and gas-delivery system, and the LD777 cathode performs several roles simultaneously:

  • Couples RF power into the process gas, establishing and sustaining the capacitive discharge across the electrode gap above the wafer.
  • Provides a defined, conductive electrical reference surface that shapes the sheath and the electric field driving ions toward the wafer.
  • Acts as the upper boundary that confines and centres the plasma, helping to keep the discharge uniform from wafer centre to edge.
  • Forms part of the showerhead-style gas distribution path in many TEL designs, helping to deliver process gas symmetrically into the discharge region.
  • Contributes to the RF return and grounding topology of the chamber, stabilising impedance seen by the matching network.
  • Influences chamber wall and surface chemistry through the material it is made from, affecting polymer deposition, etch by-product behaviour and overall process repeatability.

Material and process performance

As a plasma-facing cathode, the LD777 must combine controlled electrical conductivity with chemical and physical resistance to an aggressive fluorocarbon, oxygen or halogen plasma environment. Its performance is governed both by the bulk material from which it is machined and by the finish and flatness of the surface presented to the discharge.

Plasma and erosion resistance

The cathode surface is continuously bombarded by energetic ions and exposed to reactive radicals. The material and surface treatment are selected to keep erosion slow and uniform so that the electrical and dimensional properties stay within specification across the qualified service interval.

  • Resistance to physical sputtering under sustained ion bombardment at the powered surface.
  • Chemical stability against fluorine, oxygen and chlorine-bearing process chemistries.
  • Low and predictable particle generation as the surface conditions, minimising defect adders on the wafer.
  • Uniform erosion behaviour so that field shaping does not skew unevenly across the electrode face.

Electrical and thermal behaviour

Beyond resisting the plasma, the cathode must present a stable electrical and thermal interface. Consistent conductivity and clean contact surfaces keep RF coupling repeatable, while controlled thermal contact prevents local hot spots that would otherwise change local etch behaviour.

  • Stable bulk resistivity for repeatable RF power coupling into the discharge.
  • Clean, flat mating and contact surfaces for a low-resistance electrical and RF return path.
  • Predictable heat conduction away from the plasma-facing surface to maintain thermal uniformity.
  • Dimensional accuracy that preserves the designed electrode gap and field geometry.

Impact on tool performance and yield

Because the upper electrode cathode sits at the heart of the discharge, its condition feeds directly into the metrics that fabs care about most. A worn, contaminated or out-of-specification cathode does not simply fail outright, it quietly shifts the process, and the consequences accumulate across every wafer the chamber runs:

  • Drift in etch rate and within-wafer uniformity as the surface erodes and field shaping changes.
  • Unstable plasma ignition or matching as electrical properties of the cathode degrade.
  • Rising particle counts and defect adders as eroded material and flaking deposits release onto the wafer.
  • Shifts in critical dimension and profile control that can push devices outside specification.
  • More frequent requalification, wet cleans and seasoning runs, eroding chamber availability.
  • Reduced repeatability between chambers, complicating chamber-matching across a tool fleet.

Common wear and failure modes

Surface erosion and thinning

The dominant wear mechanism is gradual erosion of the plasma-facing surface through sputtering and chemical attack. As material is removed, the electrode gap and surface profile change, the field geometry shifts and etch uniformity drifts. Eventually thinning reaches the point where the cathode can no longer hold the qualified process within control limits and must be replaced.

Particle generation and deposit flaking

Polymer and etch by-products build up on and around the cathode between cleans. As these deposits thicken they can crack and flake, and a roughening or pitted surface becomes a particle source in its own right. This is one of the earliest yield-impacting symptoms of an ageing cathode and is often the trigger for an unscheduled intervention.

Electrical and contact degradation

Oxidation, contamination or erosion of the mounting and contact interfaces raises contact resistance and disturbs the RF return path. The result is harder plasma ignition, increased reflected power, matching-network instability and a discharge that no longer behaves the way the recipe was qualified against.

Installation and replacement guidance

Replacing the upper electrode cathode is a precision task carried out under cleanroom discipline, because contamination, poor seating or incorrect torque will all show up immediately in process performance. The following sequence reflects good practice; always defer to the tool’s own maintenance procedures and safety interlocks:

  • Place the chamber in maintenance mode, vent to atmosphere and verify that RF power and gas supplies are fully isolated and locked out.
  • Open the chamber and remove any upper-assembly shields or hardware needed to access the electrode, recording orientation and fastener positions.
  • Detach the worn cathode, inspect mating surfaces, RF contacts and seals for erosion or contamination, and clean as required.
  • Handle the new ES7099-023 cathode with clean, gloved hands or approved tooling, avoiding any contact that could contaminate the plasma-facing surface.
  • Seat the new cathode to the correct alignment and tighten fasteners in the specified pattern and torque for flatness, electrode gap and reliable electrical contact.
  • Reinstall shields and hardware, close the chamber, pump down and confirm vacuum integrity and leak-up rate.
  • Run the prescribed seasoning and requalification sequence, then verify etch rate, uniformity and particle performance before returning the tool to production.

Spare parts strategy for TEL etch consumables

Plasma-facing electrodes are consumed on a predictable schedule, so the question is never whether they will be replaced but whether the right part is on the shelf when the PM falls due. Sourcing the LD777 cathode through ESCT Fab Support as ES7099-023 gives engineering and procurement teams a dependable second source for this high-turnover item:

  • A qualified second source that reduces dependence on single-supplier OEM lead times and pricing.
  • Supplied new and verified to the form, fit and function of the original TEL upper electrode.
  • A defined 4-5 week lead time that supports planning of preventive-maintenance cycles and buffer stock.
  • Clear cross-referencing between OEM P/N DEB-1810-121988-11W and ESCT P/N ES7099-023 for accurate ordering.
  • Support for consignment or scheduled-delivery arrangements to keep critical consumables available on demand.

Frequently asked questions

What does the LD777 upper electrode cathode actually do?

It is the powered, plasma-facing upper electrode element in a TEL 300 mm etch chamber. It couples RF energy into the process gas, helps confine and shape the discharge above the wafer and provides part of the chamber’s electrical reference and RF return path, all of which directly influence etch rate and uniformity.

Is this an original OEM TEL part?

No. ES7099-023 is supplied as a 2nd Source NEW, OEM-compatible part. It is manufactured new and verified to match the form, fit and function of the original TEL upper electrode (OEM P/N DEB-1810-121988-11W), but it is not an original Tokyo Electron OEM component.

How do I know when the cathode needs replacing?

Replacement is usually driven by accumulated RF hours in the preventive-maintenance plan, supported by process indicators such as drifting etch rate or uniformity, rising particle counts, harder plasma ignition or increased reflected power. Visible erosion, pitting or thinning at inspection also signals end of life.

What is the lead time for ES7099-023?

The typical lead time is 4-5 weeks. Because this is a scheduled-replacement consumable, we recommend aligning orders with your PM calendar and holding buffer stock so a chamber is never held waiting on the part.

Will it affect my qualified process window?

A correctly installed, form-fit-function-verified cathode is designed to restore the chamber to its qualified behaviour. As with any plasma-facing part, a new cathode should be followed by the prescribed seasoning and requalification routine, and etch rate, uniformity and particle performance confirmed before the tool returns to production.

Can ESCT help match this part to my specific TEL tool?

Yes. Using the OEM and ESCT part numbers together with your tool and chamber details, our team can confirm applicability before you order, helping avoid mis-shipments and confirming the cathode matches the configuration installed in your chamber.

Summary

The Upper Electrode Cathode LD777 (OEM P/N DEB-1810-121988-11W, ESCT P/N ES7099-023) is a critical plasma-facing consumable in TEL 300 mm plasma etch chambers, coupling RF power into the discharge, shaping the field above the wafer and anchoring the chamber’s electrical reference and RF return. Its condition drives etch rate, uniformity, plasma stability and particle performance, so it is replaced on a planned PM cadence. Supplied by ESCT Fab Support as a 2nd Source NEW part with a 4-5 week lead time, ES7099-023 gives fabs a dependable, verified alternative to single-source OEM supply for keeping TEL etch tools qualified and productive.

Disclaimer: This part is supplied by ESCT Fab Support as a new, OEM-compatible second-source component, verified to the form, fit and function of Tokyo Electron part number DEB-1810-121988-11W. It is not an original OEM part and is not sold as one. It is not manufactured by, endorsed by, or affiliated with Tokyo Electron, and all manufacturer names and part numbers are quoted for identification and compatibility purposes only.

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