SILICON RING , PROTECTION(TE GND FLAT)

PART DETAILS

3D87-052882-12
SILICON RING , PROTECTION(TE GND FLAT)

OEM P/N: 

3D87-052882-12

ESCT P/N: 

ES7099-054

PART TYPE:

2nd Source NEW

OEM: 

TEL
MORE INFO

Silicon protection ring, TE ground flat (OEM P/N 3D87-052882-12), edge protection and RF grounding component for TEL 300 mm plasma etch systems

ESCT P/N ES7099-054, silicon protection ring with thermocouple/ground flat feature for Tokyo Electron (TEL) etch chamber service

The Silicon Protection Ring (OEM P/N 3D87-052882-12) is a consumable plasma-facing component used in Tokyo Electron (TEL) 300 mm plasma etch process chambers. As a protection ring, it shields underlying chamber hardware (typically a cathode, electrode assembly or wafer support periphery) from direct exposure to the reactive plasma and energetic ion flux that surrounds a 300 mm wafer during etch. The “TE GND FLAT” notation in the part name denotes a machined flat or keyed feature on the ring associated with ground and thermocouple (TE) referencing, so the component seats in a single defined orientation and maintains a consistent electrical and thermal interface to the surrounding assembly.

Within the chamber, the protection ring occupies the annular zone immediately outboard of the active process area. Here it is subjected to the same aggressive environment that governs etch results at the wafer edge: high-density plasma, fluorocarbon and oxygen-bearing chemistries, RF bias and elevated surface temperatures. Because it is fabricated from silicon, the ring shares the chemical behaviour of the wafer itself, which is what keeps the plasma sheath and etch by-product chemistry uniform across the transition from the wafer to the chamber wall.

As a sacrificial silicon part, this protection ring is expected to erode in service and is replaced on a scheduled preventive maintenance interval. Its condition directly affects edge die yield, particle counts and the integrity of the RF return path, which makes it a critical line item in any TEL etch spares inventory.

Functional role of the silicon protection ring in TEL etch platforms

The protection ring performs several interdependent jobs at the chamber periphery. It is not merely a cover; it is an active participant in shaping the plasma, conducting RF current and managing the thermal and chemical boundary at the wafer edge.

  • Protects the underlying cathode, electrode or support hardware from sputter erosion and chemical attack by absorbing ion bombardment in its place.
  • Extends the silicon surface beyond the wafer edge so the plasma sheath bends uniformly across the boundary, supporting consistent edge etch rate and profile.
  • Provides a defined RF return path to ground, helping confine the plasma and stabilise the bias seen by the wafer.
  • Maintains a matched silicon chemistry around the wafer so by-product generation and loading effects do not change abruptly at the edge.
  • Uses the ground flat feature to enforce correct rotational orientation and a repeatable thermal and electrical seat during installation.
  • Acts as a replaceable sacrificial barrier so that costly base hardware is preserved across many process hours.

Material and process performance

Silicon material properties

The ring is machined from high-purity silicon so that its plasma interaction matches the silicon wafer being processed. This material choice is deliberate and central to the part’s behaviour.

  • High purity minimises metallic and mobile-ion contamination that could be liberated under ion bombardment.
  • Silicon etches in the same fluorocarbon and oxygen chemistries as the wafer, keeping edge by-product chemistry predictable.
  • Controlled resistivity supports the ring’s role in the RF return path and grounding scheme.
  • Precision flatness and dimensional control give a repeatable seat against the underlying hardware.

Plasma and thermal behaviour

In service the ring must tolerate cyclic thermal loading and continuous ion flux without distorting or shedding particles, while presenting a stable surface to the discharge.

  • Withstands repeated heat-up and cool-down cycles between idle and active plasma states without cracking.
  • Erodes slowly and predictably, giving a defined service life that can be planned into PM schedules.
  • The ground flat maintains a consistent thermal contact area so edge temperature stays repeatable from one ring to the next.
  • A smooth, intact surface limits micro-arcing and the redeposition of polymer flakes near the wafer.

Impact on tool performance and yield

Because the protection ring sits directly at the boundary between the wafer and the chamber, its condition propagates straight into device results. A worn, cracked or misoriented ring shows up first at the outermost die and in particle excursions.

  • Edge etch uniformity drifts as the ring erodes, narrowing the usable process window for outer die.
  • Particle counts rise when the silicon surface roughens or polymer accumulates and flakes from the ring.
  • An unstable RF return path can shift bias and plasma confinement, degrading critical dimension control.
  • Exposure of the underlying cathode or electrode through a depleted ring leads to expensive base-hardware damage.
  • Inconsistent grounding and orientation increase wafer-to-wafer and chamber-to-chamber variation.

Common wear and failure modes

Erosion and thinning

Continuous ion bombardment gradually sputters silicon from the exposed surface. As the ring thins, the sheath geometry at the wafer edge changes and edge etch performance drifts, eventually risking exposure of the hardware the ring is meant to protect.

Cracking and chipping

Silicon is brittle, so thermal cycling, mechanical mishandling during PM or an uneven seat against the ground flat can initiate cracks or chips. Fractured silicon is a direct particle source and can compromise the electrical contact that defines the ground reference.

Polymer build-up and arcing

Fluorocarbon chemistries deposit polymer on the ring between cleans. Excessive build-up flakes off as defects and can localise charge, leading to micro-arcing that pits the silicon and disturbs the local plasma. Degraded grounding at the flat aggravates this behaviour.

Installation and replacement guidance

Replacement is performed during scheduled preventive maintenance with the chamber vented and the tool following the OEM lockout and ESD procedures. The following sequence reflects general good practice; always defer to the applicable TEL maintenance documentation for the specific platform.

  • Vent the chamber, confirm it has cooled and verify RF power is isolated before opening the lid.
  • Note the orientation of the existing ring relative to the ground flat before removal.
  • Lift out the worn ring with clean, powder-free gloves, taking care not to scratch the underlying seat.
  • Clean and inspect the seating surface for residue, redeposition or damage that would prevent proper contact.
  • Place the new silicon ring so the ground flat aligns with its locating feature, seating it flat and even with no rocking.
  • Confirm full, gap-free contact at the grounding interface and that no debris is trapped beneath the ring.
  • Close the chamber, pump down, run the required season or conditioning recipe and verify particle and etch performance before production.

Spare parts strategy for TEL etch consumables

Protection rings are recurring consumables, so a dependable second source materially reduces both cost per wafer and the risk of unplanned downtime. ESCT Fab Support supplies this ring as a verified, fab-ready alternative to sole-source OEM procurement.

  • Second-source supply that lessens dependence on a single OEM channel for a high-turnover consumable.
  • Verified to form, fit and function so it drops into the existing PM workflow without process requalification surprises.
  • Competitive pricing on a part that is replaced repeatedly across the fleet of etch chambers.
  • A typical lead time of 4-5 weeks, supporting planned PM scheduling and buffer-stock policies.
  • Catalogued under ESCT P/N ES7099-054 against OEM P/N 3D87-052882-12 for fast, unambiguous reordering.

Frequently asked questions

What does the “TE GND FLAT” feature on this ring do?

The ground flat is a machined feature that keys the ring into a single correct orientation and defines a consistent grounding and thermal-reference interface to the surrounding hardware. It holds the RF return path and edge temperature are repeatable each time the part is fitted.

Is this an original OEM part?

No. This ring is supplied as a new, OEM-compatible second-source component. It is manufactured to match the form, fit and function of the original TEL part but is not an original OEM-branded item.

Why is the ring made of silicon rather than ceramic or quartz?

Silicon is chosen so the ring etches and interacts with the plasma in the same way as the wafer. This keeps the chemistry and sheath behaviour continuous across the wafer edge, which is important for edge uniformity and for controlling etch by-products.

How often should the protection ring be replaced?

As a sacrificial consumable, it is replaced on a process-dependent PM interval determined by accumulated RF hours, observed erosion and particle or edge-uniformity trends. The correct interval is set by your own qualification data and TEL maintenance guidance.

What happens if a worn ring is left in service too long?

Excessive erosion can expose and damage the cathode or electrode beneath the ring, raise particle counts and shift edge etch performance and RF grounding, all of which threaten edge die yield. Timely replacement protects the more expensive base hardware.

What is the lead time and how do I reorder?

The typical lead time is 4-5 weeks. Order using ESCT P/N ES7099-054, cross-referenced to OEM P/N 3D87-052882-12, so the correct silicon protection ring is identified without ambiguity.

Summary

The Silicon Protection Ring (OEM P/N 3D87-052882-12, ESCT P/N ES7099-054) is a sacrificial silicon consumable for TEL 300 mm plasma etch chambers that shields the underlying electrode hardware, supports edge etch uniformity and provides a defined ground reference through its machined ground flat. Made from high-purity silicon to match wafer chemistry, it erodes predictably and must be replaced on a planned PM interval to protect yield, particle performance and base hardware. ESCT Fab Support offers it as a verified second-source part with a 4-5 week lead time, giving fabs a cost-effective, dependable alternative for a frequently replaced chamber consumable.

Disclaimer: This part is supplied by ESCT Fab Support as a new, OEM-compatible second-source component, verified to the form, fit and function of Tokyo Electron part number 3D87-052882-12. It is not an original OEM part and is not sold as one. It is not manufactured by, endorsed by, or affiliated with Tokyo Electron, and all manufacturer names and part numbers are quoted for identification and compatibility purposes only.

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