RING,FOCUS 306-T6.5 STEP LAB

PART DETAILS

2L10-252700-11
RING,FOCUS 306-T6.5 STEP LAB

OEM P/N: 

2L10-252700-11

ESCT P/N: 

ES7099-211

PART TYPE:

2nd Source NEW

OEM: 

TEL
MORE INFO

2L10-252700-11 Focus ring for Tokyo Electron systems

306-T6.5 step lab focus ring for plasma uniformity and edge control, Tokyo Electron platforms

The 2L10-252700-11 (RING, FOCUS 306-T6.5 STEP LAB) is a precision-engineered focus ring used in Tokyo Electron plasma processing systems, designed to control wafer edge plasma behavior, support uniform ion distribution, and maintain process stability across advanced semiconductor manufacturing applications.

The 2L10-252700-11 is engineered to support a high quality level of plasma-facing performance, while functioning as part of a broader chamber functional group that contributes to edge control, process repeatability, and chamber protection.

Positioned around the wafer on the electrostatic chuck (ESC), this focus ring helps shape the electric field at the wafer perimeter, influencing plasma density, sheath behavior, and edge process conditions. Its 306 mm stepped profile and T6.5 thickness specification are engineered for process-specific plasma tuning, supporting uniform etch or deposition performance while protecting chamber hardware from direct plasma exposure.

In plasma-intensive environments, focus ring geometry and condition can materially influence yield, process repeatability, and tool uptime. Wear, erosion, dimensional drift, or incorrect profile selection can contribute to edge non-uniformity, particle generation, process instability, and reduced usable wafer area. The 2L10-252700-11 is designed to maintain stable plasma-facing performance under sustained cleanroom production conditions.

Functional role within Tokyo Electron systems

The 2L10-252700-11 functions as a critical plasma-facing consumable supporting edge process control.

Core functions include:

  • Controlling plasma density at the wafer perimeter
  • Shaping electric field behavior at the wafer edge
  • Supporting uniform etch or deposition performance
  • Reducing edge exclusion and process variability
  • Acting as a sacrificial component to protect chamber hardware
  • Supporting stable and repeatable process conditions

Design, quality level, and performance characteristics

Edge plasma control and uniformity functional group performance

The focus ring directly influences wafer edge process behavior.

Key performance characteristics include:

  • Controlled plasma density at the perimeter
  • Improved edge uniformity in plasma processing
  • Reduced process variation near the wafer edge
  • Stable performance across process cycles
  • Support for tighter process control windows

Reliable focus ring performance is critical to maintaining repeatable plasma behavior.

Geometry and thickness specification (306-T6.5 STEP)

The ring’s stepped profile and thickness are central to process tuning.

Performance attributes include:

  • 306 mm class geometry for process-specific applications
  • T6.5 thickness supporting sheath and ion distribution control
  • Stepped profile for controlled plasma interaction
  • Tight dimensional tolerances for repeatability
  • Profile stability supporting consistent chamber behavior

Even small dimensional deviations may affect plasma uniformity and edge performance.

Material compatibility and plasma resistance

The focus ring is exposed to aggressive plasma conditions and high-energy process environments.

Durability characteristics include:

  • Materials selected for plasma erosion resistance
  • Compatibility with reactive process chemistries
  • Low particle generation properties
  • Stable performance under sustained plasma exposure
  • Resistance to geometry degradation over service life

Integration with related chamber hardware

The 2L10-252700-11 may operate alongside related consumables and chamber components including:

  • 2L10-251877-11 focus ring variants
  • 1000-1502 related chamber consumables

Together, these components contribute to plasma stability, chamber protection, and process repeatability.

Impact on process performance, yield, and tool uptime

The 2L10-252700-11 is directly tied to process quality and wafer edge performance.

Potential impacts of wear or degradation include:

  • Edge non-uniformity in etch or deposition
  • Increased edge defects
  • Reduced usable wafer area
  • Process drift and variability
  • Increased particle generation
  • Narrower process windows
  • Increased maintenance frequency and downtime

Replacing a worn focus ring can restore plasma control and improve process stability.

Common failure modes and diagnostic indicators

Plasma erosion and geometry drift

Continuous plasma exposure may alter ring dimensions over time.

Indicators include:

  • Surface erosion or rounding
  • Thickness reduction or T6.5 drift
  • Changes in plasma behavior
  • Edge process instability
  • Reduced repeatability in chamber performance

Particle generation and surface degradation

Material wear can introduce contamination risks.

Symptoms may include:

  • Increased particle counts
  • Surface roughening or flaking
  • Defectivity near wafer edge
  • Chamber contamination concerns

Edge process degradation

Worn or incorrect-profile rings may affect process performance.

Indicators include:

  • Increased edge exclusion
  • Non-uniformity near the perimeter
  • Wafer-to-wafer variability
  • Process tuning instability

Installation and maintenance best practices

To support best performance:

  • Follow OEM-approved cleanroom handling procedures
  • Inspect for erosion, cracks, or contamination before installation
  • Verify correct seating and orientation on the ESC
  • Replace based on wear thresholds or preventive maintenance schedules
  • Perform chamber seasoning and qualification after replacement
  • Monitor edge uniformity and particle trends
  • Validate process performance before production return

OEM part number and compatibility

The 2L10-252700-11 (306-T6.5 STEP LAB) is a Tokyo Electron OEM focus ring.

Key considerations:

  • Must match chamber geometry and process requirements
  • Thickness and stepped profile are critical to plasma tuning
  • Compatibility depends on tool type and process recipe
  • Verify OEM specifications before replacement
  • Evaluate related consumables during chamber service events

Why source from ESCT Fab Support

ESCT advantages

  • OEM-aligned dimensional and material verification
  • Cleanroom-compliant handling and packaging
  • Verified compatibility support
  • Faster availability versus OEM lead times
  • Reduced Mean Time To Repair (MTTR)
  • Expertise in plasma-facing consumables
  • Second-new and refurbishment options where applicable

Frequently asked questions

1. What does “306-T6.5 STEP” mean?

It refers to a 306 mm class focus ring with a 6.5 mm thickness and a stepped profile, all of which influence plasma behavior and edge process control.

2. How does this focus ring affect plasma uniformity?

It shapes electric field and plasma density behavior at the wafer perimeter, supporting more uniform etch or deposition performance.

3. Why is thickness (T6.5) important?

Thickness affects plasma sheath formation, ion distribution, and edge process behavior. Small deviations can materially impact process uniformity.

4. What is the purpose of the stepped profile?

The stepped geometry is engineered for process-specific plasma interaction and can influence edge tuning and chamber performance.

5. What are common signs of focus ring wear?

Typical indicators include:

  • Visible erosion
  • Increased particles
  • Edge non-uniformity
  • Process drift
  • Wafer edge defectivity

6. Can a worn focus ring impact yield?

Yes. Degraded focus rings can contribute to edge defects, variability, reduced process margins, and potential yield loss.

7. How often should it be replaced?

Replacement depends on process chemistry, plasma intensity, wear rates, and preventive maintenance schedules. Monitoring edge performance is critical.

8. Can ESCT verify OEM-aligned specifications?

Yes. ESCT supports dimensional, material, and compatibility verification aligned with OEM requirements.

9. What happens if the wrong profile is used?

Incorrect geometry can disrupt plasma distribution, alter process tuning, and increase risk of non-uniform processing or yield excursions.

10. Is this an original OEM part?

This product is supplied as a 2nd New OEM-compatible assembly, verified to meet form, fit, and functional requirements aligned with the relevant part number. It is not an original OEM manufacturer part.

Summary

The 2L10-252700-11 Focus Ring (306-T6.5 STEP LAB) is a mission-critical plasma-facing consumable that supports wafer edge control, process uniformity, and chamber stability in Tokyo Electron systems. Its geometry, material condition, and integration with surrounding chamber hardware can directly influence yield, process repeatability, and uptime.

Sourcing through ESCT Fab Support provides verified material quality, dimensional accuracy, faster availability, and semiconductor-focused technical expertise to help maintain stable, high-performance process operations.

Disclaimer: This part is supplied by ESCT Fab Support as a new, OEM-compatible second-source component, verified to the form, fit and function of Tokyo Electron part number 2L10-252700-11. It is not an original OEM part and is not sold as one. It is not manufactured by, endorsed by, or affiliated with Tokyo Electron, and all manufacturer names and part numbers are quoted for identification and compatibility purposes only.

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