Graphite, 9AP95002 Beamstop, Single Position

PART DETAILS

0020-82832
Graphite, 9AP95002 Beamstop, Single Position

OEM P/N: 

0020-82832

ESCT P/N: 

ES227-0097

PART TYPE:

2nd

OEM: 

AMAT
MORE INFO

Graphite beamstop, single position (OEM P/N 0020-82832), high-purity beam dump for AMAT ion implanter beamline systems

ESCT P/N ES227-0097, single-position graphite beamstop assembly (sub-component 9AP95002) for AMAT source and beamline platforms

The Graphite Beamstop, Single Position is a high-purity graphite beam-termination component used in the beamline of Applied Materials (AMAT) ion implanter systems. Designated by AMAT part number 0020-82832 and carrying the internal sub-assembly identifier 9AP95002, it is the machined graphite element that physically intercepts and absorbs an unwanted or non-implanting ion beam, dissipating the beam’s kinetic energy as heat while containing the resulting sputtered material and secondary electrons. In a tool family where a focused beam can carry tens of milliamperes at energies from a few keV to several hundred keV, the beamstop is the surface that takes the punishment so that the end-station, wafer and downstream optics do not.

The “single position” designation indicates that this beamstop occupies one fixed location in the beam path, typically used for beam setup, tuning, dose verification or a parked/blanked beam state, rather than being part of a multi-aperture or indexed array. It sits in the high-vacuum beamline downstream of the analyser magnet and resolving aperture, in the region where the beam is characterised before it is allowed to reach the wafer. Because it is fabricated from graphite rather than a metal, the component is deliberately chosen for its combination of low atomic number, high thermal tolerance and low sputter yield, all of which directly limit metallic contamination of the process environment.

Although it is a passive, non-electronic part, the beamstop’s condition has an outsized influence on beam metrology accuracy, vacuum cleanliness and particle performance. A degraded, eroded or contaminated beamstop quietly undermines dose repeatability and can become a particle source, which is why it is treated as a scheduled consumable on a well-run preventive maintenance programme.

Functional role of the graphite beamstop in AMAT ion implanter platforms

Within the beamline, the single-position graphite beamstop performs several closely related jobs that together protect the tool and underpin reliable dosimetry:

  • Terminating the ion beam during setup, tuning and parked states, absorbing the full beam current so it never reaches the wafer or end-station hardware.
  • Converting beam kinetic energy into heat and radiating or conducting it away without melting, outgassing excessively or warping.
  • Minimising sputtered ejecta and back-scattered species by presenting a low-Z, low-sputter-yield carbon surface to the incoming ions.
  • Suppressing and containing secondary electrons generated at impact, supporting accurate Faraday-based beam current and dose measurement.
  • Defining a known, stable target geometry so that beam profile, position and current can be repeatably referenced during calibration.
  • Protecting adjacent beamline structures, insulators and the vacuum envelope from direct, localised high-energy beam strike.

Material and process performance

Graphite grade and thermal behaviour

The beamstop is machined from a high-purity, fine-grained graphite selected for its ability to survive direct ion bombardment. Graphite has no true melting point at vacuum pressures, it sublimes only at extreme temperatures, so it tolerates the intense, localised heating of a parked beam far better than most metals. Its high thermal conductivity helps spread the deposited heat across the body of the part, while its low coefficient of thermal expansion keeps the impact geometry stable through repeated heating and cooling cycles, preserving the reference position used during beam tuning.

  • High sublimation threshold tolerates localised hot spots without melting or splatter.
  • Good thermal conductivity distributes beam-deposited energy across the part body.
  • Low thermal expansion maintains dimensional and positional stability between cycles.
  • Fine, dense grain structure resists flaking and limits particle shedding.

Contamination control and sputter resistance

Carbon’s low atomic number is the key reason graphite is preferred over metal for beam-termination duty. Low-Z material sputters less aggressively and, crucially, any material that is sputtered is carbon rather than a process-killing metal such as iron, chromium or nickel. This keeps the beamline and the wafer environment free of heavy-metal contamination that would degrade device performance. High vacuum compatibility, low outgassing once conditioned, further protects the pressure and cleanliness of the beamline.

  • Low-Z carbon surface produces benign, low-yield sputtered ejecta.
  • Avoids introducing metallic contamination into the implant environment.
  • Low outgassing supports stable high-vacuum operation after conditioning.
  • Compatible with the dopant species and energetic conditions of the beamline.

Impact on tool performance and yield

Because the beamstop is the reference surface for beam setup and the guardian against stray beam strike, its condition feeds directly into the parameters that matter most to a fab:

  • Dose accuracy and repeatability, since a stable beamstop supports clean Faraday current readings during tuning and verification.
  • Particle performance, as an eroded or flaking beamstop becomes a source of carbon debris that can migrate downstream.
  • Vacuum integrity, because excessive outgassing or eroded surfaces slow pump-down and disturb beamline pressure.
  • Beam tuning time, where a worn or displaced reference surface lengthens setup and reduces tool availability.
  • Protection of expensive neighbouring hardware from direct, uncontrolled beam impingement.
  • Overall implant uniformity and process window, which depend on a trustworthy, well-characterised beam.

Common wear and failure modes

Erosion and cratering

Continuous, concentrated beam strike gradually sputters and erodes the impact zone, forming a crater or pit. As the surface recedes and roughens, the effective target geometry changes, secondary-electron and back-scatter behaviour shifts, and the beamstop can no longer serve as a clean, repeatable reference. Deep cratering is the most common end-of-life indicator.

Thermal stress and cracking

Repeated rapid heating from beam strike followed by cooling imposes thermal-cycling stress on the graphite. Over time this can promote micro-cracking, edge chipping or, in severe cases, fracture, particularly if a high-current beam is parked on a small spot. Cracked or chipped graphite both compromises the absorbing surface and generates particles.

Deposition, flaking and particle generation

Sputtered material and process by-products can build up on and around the beamstop, eventually flaking away as the part ages. Loose graphite grains and redeposited films become a particle source that can travel through the beamline, contaminating the vacuum environment and ultimately threatening wafer-level defect performance.

Installation and replacement guidance

Replacement should always follow the relevant AMAT service procedures and your site’s safety protocols. As a general guide, the sequence is:

  • Place the tool in a safe state: disable the beam and source, lock out high voltage, and follow lockout/tagout before any beamline access.
  • Vent the relevant beamline section to atmosphere in a controlled manner and confirm it is safe to open.
  • Open the access flange or housing and note the orientation and mounting of the existing single-position beamstop before removal.
  • Remove the worn graphite beamstop, handling it carefully to avoid spreading loose particles, and clean the mounting interface.
  • Fit the replacement using clean, gloved handling, with correct seating, alignment and positional reference to the beam path.
  • Reassemble the housing, restore the seals and pump the section back down, verifying the target base pressure is reached.
  • Re-tune and re-verify the beam against the new beamstop, confirming current, profile and dose calibration before returning to production.

Spare parts strategy for AMAT ion implanter beamlines

Graphite beam-termination components are consumables: they wear predictably and benefit from being held on the shelf rather than ordered in a crisis. Sourcing them through ESCT Fab Support gives implant teams a practical way to keep beamlines running without overcommitting capital:

  • Form, fit and function verification against AMAT P/N 0020-82832 so the part drops into the intended single position.
  • Short, predictable lead time of approximately 2.5 weeks to support planned preventive maintenance scheduling.
  • Cost-effective alternative to OEM list pricing for a routinely consumed beamline part.
  • Clear ESCT reference (ES227-0097) for straightforward reordering and inventory tracking.
  • Knowledgeable support on source and beamline consumables across AMAT implant platforms.
  • Helps reduce unplanned downtime by keeping a known-wear consumable readily available.

Frequently asked questions

What does this graphite beamstop actually do?

It is a passive graphite target that intercepts and absorbs the ion beam at a fixed single position in the beamline, used for setup, tuning, verification or a parked beam, dissipating the beam energy as heat while limiting sputtering, contamination and stray beam strike.

Is this an original AMAT OEM part?

No. This is supplied as a new OEM-compatible part that is verified to the form, fit and function of AMAT P/N 0020-82832. It is not an original AMAT-branded OEM part, but it is intended as a direct functional replacement for the single-position graphite beamstop.

Why is graphite used instead of metal?

Graphite is a low atomic number material that withstands extreme localised heating without melting and sputters far less aggressively than metals. Any material it does shed is carbon rather than heavy metal, which protects the wafer environment from contamination.

How do I know when it needs replacing?

Look for visible cratering or erosion at the impact zone, cracking or chipping, and signs of flaking or particle generation. Drift in beam-tuning behaviour or repeatability that traces back to the reference surface is also a strong indicator that the beamstop is at end of life.

Does replacing it require recalibration?

Yes. Because the beamstop serves as a positional and current reference during tuning, the beam should be re-tuned and dose calibration re-verified against the new part before returning the tool to production.

What is the typical lead time?

The current lead time is approximately 2.5 weeks. As a known-wear consumable, it is well suited to being held in spares inventory so that scheduled maintenance is never held up waiting on delivery.

Summary

The Graphite Beamstop, Single Position (AMAT P/N 0020-82832, ESCT P/N ES227-0097) is a high-purity graphite beam-termination component for AMAT ion implanter beamlines. It absorbs the ion beam at a fixed position for setup, tuning and parked states, converting beam energy to heat while minimising sputtering, metallic contamination and stray beam strike. Its condition directly affects dose accuracy, particle performance and vacuum cleanliness, and because it wears predictably through erosion, thermal cracking and flaking, it is best managed as a stocked consumable. Sourced through ESCT Fab Support with a short, predictable lead time, it offers a cost-effective, function-verified way to keep beamlines productive.

Disclaimer: This part is supplied by ESCT Fab Support as a new, OEM-compatible second-source component, verified to the form, fit and function of Applied Materials part number 0020-82832. It is not an original OEM part and is not sold as one. It is not manufactured by, endorsed by, or affiliated with Applied Materials, and all manufacturer names and part numbers are quoted for identification and compatibility purposes only.

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