PRE-ACCEL STACK

PART DETAILS

0090-90388
PRE-ACCEL STACK

OEM P/N: 

0090-90388

ESCT P/N: 

ES3033-120

PART TYPE:

N/A

OEM: 

AMAT
Repair Offered
MORE INFO

Pre-acceleration electrode stack (OEM P/N 0090-90388), beam extraction and pre-acceleration assembly for AMAT Quantum / xR-class ion implantation systems

ESCT Fab Support Replacement, ESCT P/N ES3033-120, for the source and extraction subsystem of Applied Materials high-current and high-energy implanters

The Pre-Acceleration Electrode Stack is the multi-electrode assembly that sits immediately downstream of the ion source extraction aperture on Applied Materials (AMAT) ion implantation platforms. Its job is to take the freshly extracted, low-energy ion beam emerging from the source plasma and impart the first, carefully shaped stage of acceleration before the beam enters the analyser magnet and the main acceleration column. The “stack” terminology reflects its physical construction: a series of precision metal electrodes, separated and supported by high-voltage insulators, stacked along the beam axis so that a graded electrostatic potential can be applied across successive gaps.

Within the source and beamline architecture of Quantum and xR-class tools, this assembly occupies one of the most electrically and thermally demanding positions in the entire system. It operates inside high vacuum, directly exposed to the ion beam, to sputtered source material and to the intense electric fields needed to draw ions out of the plasma meniscus and begin their journey down the beamline. The quality of the beam that every subsequent subsystem receives (the mass analyser, the post-acceleration optics and the end-station scanning) is largely determined by how cleanly and stably this first electrode stack extracts and pre-accelerates the ions.

Because the electrode stack defines the initial beam emittance, divergence and energy, its condition has an outsized effect on dose uniformity, beam current and implant repeatability. A worn, contaminated or electrically degraded stack is one of the most common root causes of unstable extraction, glitching and beam-current droop on these implanters, which is why a known-good replacement is a critical line item for any AMAT implant toolset.

Functional role of the pre-acceleration electrode stack in AMAT ion implantation platforms

The pre-acceleration electrode stack performs the electrostatic optics function that bridges the ion source and the analysed beamline. By holding each electrode at a precisely controlled potential, it shapes the field that extracts ions and accelerates them to an intermediate energy suited to mass analysis. Its principal functions include:

  • Drawing ions from the source plasma meniscus through the extraction aperture at controlled current density.
  • Applying a graded acceleration field across successive electrode gaps to bring the beam to its pre-analysis energy.
  • Shaping beam optics (focus, divergence and emittance) so the beam enters the analyser magnet with the correct geometry.
  • Providing a suppression electrode stage that rejects back-streaming secondary electrons and prevents space-charge blow-up at the extraction gap.
  • Maintaining mechanical alignment of all electrode apertures to the beam axis within tight tolerances.
  • Withstanding the applied extraction and pre-acceleration potentials without arcing or leakage across its insulators.

Electrical and signal performance

High-voltage standoff and field control

The defining electrical requirement of the stack is reliable high-voltage standoff between electrodes that may differ by tens of kilovolts across a few millimetres of vacuum gap. The insulators must hold off these potentials cleanly while the electrode surfaces remain smooth enough to avoid local field enhancement.

  • Stable extraction and suppression voltages with minimal leakage current across insulators.
  • Low arc and glitch rate, since each high-voltage breakdown disturbs the beam and can trip the supplies.
  • Consistent gap geometry so the applied potential produces the intended field strength.
  • Clean conductive surfaces that prevent charge accumulation and tracking.

Beam optics and current stability

Electrically, the stack also behaves as an electrostatic lens. The relationship between electrode potentials and aperture geometry determines the focal properties of the extracted beam, which in turn governs how much usable current the tool can deliver to the wafer.

  • Repeatable focus and beam profile across the operating energy and current range.
  • Predictable transmission of beam current into the analyser without excessive losses on the electrodes.
  • Stable beam position and angle entering the mass-resolving slit.
  • Low secondary-electron loading on the extraction power supplies.

Impact on tool performance and yield

Because the pre-acceleration electrode stack defines the starting condition of the beam, its health propagates directly into process results at the wafer. Degradation here is rarely contained to a single subsystem; it shows up as drifting dose, marginal beam current and rising tool downtime. Typical consequences of a degraded or failing stack include:

  • Reduced or unstable beam current, lengthening implant times and reducing throughput.
  • Dose non-uniformity and repeatability excursions that threaten device threshold-voltage targets.
  • Frequent high-voltage glitching that trips the extraction supplies and aborts runs.
  • Beam-quality drift that demands more frequent re-tuning and qualification.
  • Particle generation from flaking sputter deposits, raising defect counts and contamination risk.
  • Unscheduled source-housing maintenance and the associated vacuum recovery time.

Common failure modes

Sputter erosion and deposition

The electrodes sit directly in the path of the ion beam and the source effluent, so their aperture edges erode over time while sputtered material redeposits elsewhere on the stack. This slowly changes aperture geometry and beam optics, and the conductive deposits can bridge insulators, degrading standoff and altering the field that the stack produces.

High-voltage breakdown and insulator tracking

Contamination films, surface roughening and micro-particles all promote arcing across the high-voltage gaps. Once tracking marks form on an insulator, breakdown becomes progressively easier, producing the recurrent glitching that destabilises extraction and stresses the power supplies. Severe or repeated arcing can permanently carbonise the insulator surface.

Thermal and mechanical distortion

Beam interception and radiant heat from the source cycle the electrodes through large temperature swings. Repeated thermal expansion can warp electrodes, loosen fasteners and shift inter-electrode spacing, while mechanical misalignment of the apertures relative to the beam axis introduces aberrations, beam clipping and localised heating.

Installation and replacement guidance

The electrode stack lives inside the high-voltage source terminal and is exposed to lethal potentials and high vacuum, so replacement must follow the AMAT-prescribed lockout and safety procedure for the source and extraction subsystem. The following sequence outlines the general workflow; always defer to the tool’s service documentation and site safety rules.

  • Place the implanter in a safe service state, lock out the high-voltage supplies and confirm the terminal is fully discharged and grounded.
  • Vent the source chamber to the appropriate level and gain access to the extraction and pre-acceleration region.
  • Disconnect the electrode high-voltage connections and remove the existing stack assembly, noting electrode order and orientation.
  • Inspect mating surfaces, insulators and alignment features; clean away sputter deposits and verify the seating datums are undamaged.
  • Install the replacement stack, observing correct electrode sequence, gap spacing and aperture alignment to the beam axis.
  • Reconnect the high-voltage leads, restore the chamber, pump down and confirm the target vacuum and leak integrity.
  • High-voltage condition the stack, then re-tune extraction and suppression voltages and verify beam current, profile and stability before returning to production.

Spare parts strategy for AMAT ion implantation systems

The pre-acceleration electrode stack is a consumable-class, high-wear assembly, which makes it a prime candidate for proactive stocking rather than reactive ordering. Holding a verified spare lets a fab swap a degraded stack during a planned source preventive-maintenance window instead of waiting on procurement during an unplanned beam-quality excursion. ESCT Fab Support offers several advantages for sourcing this part:

  • Form, fit and function verification against AMAT OEM P/N 0090-90388 under ESCT P/N ES3033-120.
  • A cost-effective alternative to original OEM pricing for a routinely replaced wear item.
  • Support for buffer-stock and consignment strategies that protect tool availability.
  • Application knowledge specific to the AMAT source and extraction subsystem.
  • A single point of contact for related source, extraction and beamline spares.

Frequently asked questions

What does the pre-acceleration electrode stack actually do?

It extracts ions from the source plasma and applies the first stage of acceleration, shaping the beam optics before the beam reaches the analyser magnet. In effect it sets the starting energy, current and emittance of the entire beamline.

Is this an original AMAT OEM part?

No. This is an OEM-compatible replacement supplied by ESCT Fab Support, cross-referenced to AMAT OEM P/N 0090-90388 and verified to match the original in form, fit and function. It is not an original AMAT part and is not sold as one.

How do I know when the stack needs replacing?

Typical indicators are rising high-voltage glitch rates, falling or unstable beam current, increasing difficulty holding dose uniformity, and visible erosion or heavy deposition during source maintenance. Many fabs replace it on a scheduled interval tied to source PM cycles.

Which AMAT tools is it used on?

It is used in the source and extraction subsystem of Applied Materials Quantum and xR-class ion implantation platforms. Confirm applicability for your specific tool by matching against AMAT P/N 0090-90388 and your machine configuration.

Does replacing it require beam re-qualification?

Yes. After installation the stack must be high-voltage conditioned, extraction and suppression voltages re-tuned, and beam current, profile and stability verified before the tool is released to production, in line with your qualification procedures.

Should I keep one in stock?

For most implant toolsets, yes. As a high-wear, beam-facing assembly whose condition directly affects yield, it is well suited to buffer stocking so a degraded stack can be replaced during planned maintenance rather than during an unexpected excursion.

Summary

The Pre-Acceleration Electrode Stack (AMAT OEM P/N 0090-90388, ESCT P/N ES3033-120) is the beam-facing electrostatic optics assembly that extracts and pre-accelerates the ion beam on AMAT Quantum and xR-class implanters. Its condition governs beam current, dose uniformity and high-voltage stability across the whole beamline, and as a high-wear consumable it benefits from proactive stocking. ESCT Fab Support supplies a verified, cost-effective replacement to keep these implanters running with minimal downtime.

Disclaimer: This part is supplied by ESCT Fab Support as a new, OEM-compatible second-source component, verified to the form, fit and function of Applied Materials part number 0090-90388. It is not an original OEM part and is not sold as one. It is not manufactured by, endorsed by, or affiliated with Applied Materials, and all manufacturer names and part numbers are quoted for identification and compatibility purposes only.

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